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Journal articles
Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
Abstract : Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects.
Cited literature [16 references]
https://hal-mines-paristech.archives-ouvertes.fr/hal-00491060
Contributor : Bibliothèque Umr7633 <>
Submitted on : Tuesday, February 20, 2018 - 2:27:46 PM
Last modification on : Saturday, October 3, 2020 - 3:15:29 AM
Long-term archiving on: : Monday, May 21, 2018 - 1:06:23 PM
Contributor : Bibliothèque Umr7633 <>
Submitted on : Tuesday, February 20, 2018 - 2:27:46 PM
Last modification on : Saturday, October 3, 2020 - 3:15:29 AM
Long-term archiving on: : Monday, May 21, 2018 - 1:06:23 PM
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