Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

Nicolas Vaxelaire (1) , Henry Proudhon (2) , S. Labat (1) , C. Kirchlechner , J. Keckes , V. Jacques (3) , S. Ravy (3) , Samuel Forest (2) , O. Thomas (1)

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
2 MAT - Centre des Matériaux
3 SSOLEIL - Synchrotron SOLEIL

Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects.

Domaines: Sciences de l'ingénieur [physics]; Matériaux

Nicolas Vaxelaire, Henry Proudhon, S. Labat, C. Kirchlechner, J. Keckes, et al.. Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics, 2010, 12 (3), 12 p. ⟨10.1088/1367-2630/12/3/035018⟩. ⟨hal-00491060⟩