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Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

Abstract : Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects.
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Nicolas Vaxelaire, Henry Proudhon, S. Labat, C. Kirchlechner, J. Keckes, et al.. Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics, Institute of Physics: Open Access Journals, 2010, 12 (3), 12 p. ⟨10.1088/1367-2630/12/3/035018⟩. ⟨hal-00491060⟩

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