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Article Dans Une Revue Advanced Engineering Materials Année : 2003

Measurement of in-grain orientation gradients by EBSD and comparison with finite element results

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Résumé

The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.

Dates et versions

hal-00531614 , version 1 (03-11-2010)

Identifiants

Citer

Luc Delannay, Roland E. Logé, Yvan Chastel, Javier W. Signorelli, Paul van Houtte. Measurement of in-grain orientation gradients by EBSD and comparison with finite element results. Advanced Engineering Materials, 2003, 5 (8), p. 597-600 /. ⟨10.1002/adem.200300376⟩. ⟨hal-00531614⟩
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