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Measurement of in-grain orientation gradients by EBSD and comparison with finite element results

Abstract : The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.
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https://hal-mines-paristech.archives-ouvertes.fr/hal-00531614
Contributor : Magalie Prudon <>
Submitted on : Wednesday, November 3, 2010 - 12:30:27 PM
Last modification on : Thursday, September 24, 2020 - 5:22:54 PM

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Luc Delannay, Roland E. Logé, Yvan Chastel, Javier W. Signorelli, Paul van Houtte. Measurement of in-grain orientation gradients by EBSD and comparison with finite element results. Advanced Engineering Materials, Wiley-VCH Verlag, 2003, 5 (8), p. 597-600 /. ⟨10.1002/adem.200300376⟩. ⟨hal-00531614⟩

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