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About SIMS analysis of organic materials

Abstract : The specific parameters of secondary ion mass spectrometry (SIMS) for each regime (static or dynamic) are summarised. The particular aspects of organic material SIMS investigation are addressed, focusing on the analytical choices and problems. Examples of studies are proposed for both regimes, chosen either from the literature or amongst investigations conducted at CEMEF; they illustrate from a didactic viewpoint the interest of SIMS for the study of organic material surfaces.
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Submitted on : Monday, November 22, 2010 - 2:10:29 PM
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  • HAL Id : hal-00538398, version 1


Evelyne Darque-Ceretti, Robert Combarieu, Marc Aucouturier. About SIMS analysis of organic materials. Le Vide, Société française du vide, 1999, 54 (292), p.141 +/. ⟨hal-00538398⟩



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