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About SIMS analysis of organic materials

Evelyne Darque-Ceretti 1 Robert Combarieu 1 Marc Aucouturier 2, 3
1 CEMEF - Centre de Mise en Forme des Matériaux
2 C2RMF - Centre de recherche et de restauration des musées de France
3 UP11 - Université Paris-Sud - Paris 11
Abstract : The specific parameters of secondary ion mass spectrometry (SIMS) for each regime (static or dynamic) are summarised. The particular aspects of organic material SIMS investigation are addressed, focusing on the analytical choices and problems. Examples of studies are proposed for both regimes, chosen either from the literature or amongst investigations conducted at CEMEF; they illustrate from a didactic viewpoint the interest of SIMS for the study of organic material surfaces.
Keywords : static SIMS dynamic SIMS organic materials pollution adsorption
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https://hal-mines-paristech.archives-ouvertes.fr/hal-00538398
Contributor : Corinne Matarasso <>
Submitted on : Monday, November 22, 2010 - 2:10:29 PM
Last modification on : Wednesday, October 14, 2020 - 4:02:44 AM

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  • HAL Id : hal-00538398, version 1

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CNRS | PARISTECH | ENSMP | ENSMP_CEMEF | INSTITUT-TELECOM | C2RMF | PSL

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Evelyne Darque-Ceretti, Robert Combarieu, Marc Aucouturier. About SIMS analysis of organic materials. Le Vide, Société française du vide, 1999, 54 (292), p.141 +/. ⟨hal-00538398⟩

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