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Article Dans Une Revue Ultramicroscopy Année : 2011

Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

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Résumé

We study materials that present challenges for conventional elemental mapping techniques and can in some cases be treated successfully using independent component analysis (ICA). In this case the material in question is obtained from a TiO2-SiO2 solid solution that is spinodally decomposed into TiO2 rich-SnO2 rich multilayers. Conventional elemental mapping is difficult because the edges most easily mapped for these elements (Ti-L, Sn-M and O-K) all have onsets within the same 80 eV range. ICA is used to separate entire spectral signals corresponding to particular material phases or molecular units rather than particular elements and is thus able to distinguish between TiO2 and SnO2. We show that quantification of oxide species can be performed by different methods that require extra assumptions, but nevertheless should be feasible in many cases.
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Dates et versions

hal-00553165 , version 1 (06-01-2011)

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Francisco de La Peña, Marie-Hélène Berger, Jean-François Hochepied, F. Dynys, Odile Stephan, et al.. Mapping titanium and tin oxide phases using EELS: An application of independent component analysis. Ultramicroscopy, 2011, 111, pp.169-176. ⟨10.1016/j.ultramic.2010.10.001⟩. ⟨hal-00553165⟩
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