How to characterize the regularity of surface topographies?

Gildas Guillemot 1, 2 Maxence Bigerelle 3 Jérôme Antoni 4 K. Anselme 5
1 LML - Laboratoire de Mécanique de Lille - FRE 3723
2 CEMEF - Centre de Mise en Forme des Matériaux
3 Roberval - Roberval
4 UTC - Université de Technologie de Compiègne
5 ICSIM - Institut de chimie des surfaces et interfaces de Mulhouse
Abstract : In this paper, a new parameter is proposed to characterize the regularity of a surface topography. The regularity of the surface with scaling invariance both in amplitude and position allows us to quantify the organization of surfaces by a number lying between 0 and 100%. This parameter is used to quantify the influence of different processes on the topography of the surface and calibrated on noisy periodical surface topography.
Keywords : Condensed matter electrical magnetic and optical Surfaces interfaces thin films
Type de document :
Communication dans un congrès
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https://hal-mines-paristech.archives-ouvertes.fr/hal-00676717
Contributeur : Magalie Prudon <>
Soumis le : mardi 6 mars 2012 - 09:58:58
Dernière modification le : mardi 18 février 2020 - 09:42:56

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CNRS | UNIV-COMPIEGNE | ENSMP | ENSMP_CEMEF | PARISTECH | INSTITUT-TELECOM | PSL | ROBERVAL | UNIV-LILLE

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Gildas Guillemot, Maxence Bigerelle, Jérôme Antoni, K. Anselme. How to characterize the regularity of surface topographies?. 13th International Conference on Metrology and Properties of Engineering Surfaces, Apr 2011, Twickenham, United Kingdom. 6 p., ⟨10.1088/1742-6596/311/1/012012⟩. ⟨hal-00676717⟩

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