Accéder directement au contenu Accéder directement à la navigation
Article dans une revue

Synchrotron and neutron laminography for three-dimensional imaging of devices and flat material specimens

Abstract : Computed laminography has been introduced to synchrotron and neutron imaging set-ups to complement computed tomography for three-dimensional imaging of laterally extended (i. e. plate-like) specimens. The wide application field of computed laminography due to different contrast modes (X-ray or neutron absorption and X-ray phase contrast) and spatial resolutions ranging from some 100 down to approximately 0.5 μm is demonstrated. Selected examples from device inspection and from materials science are reported. They outline the interest of the method for nondestructive and in-situ measurements of regions of interest in large planar specimens where engineering-relevant boundary conditions have to be met. With a materials science background, the in-situ investigation of crack propagation in aluminium sheets and carbon-fibre composite panels under mechanical loading is reported.
Type de document :
Article dans une revue
Liste complète des métadonnées

https://hal-mines-paristech.archives-ouvertes.fr/hal-00683973
Contributeur : Bibliothèque Umr7633 <>
Soumis le : vendredi 30 mars 2012 - 12:13:03
Dernière modification le : mercredi 14 octobre 2020 - 04:02:23

Lien texte intégral

Identifiants

Citation

Lukas Helfen, Thilo F. Morgeneyer, F. Xu, M. Mavrogordato, I. Sinclair, et al.. Synchrotron and neutron laminography for three-dimensional imaging of devices and flat material specimens. International Journal of Materials Research, 2012, 103, pp.170-173. ⟨10.3139/146.110668⟩. ⟨hal-00683973⟩

Partager

Métriques

Consultations de la notice

421