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Article Dans Une Revue International Journal of Materials Research Année : 2012

Synchrotron and neutron laminography for three-dimensional imaging of devices and flat material specimens

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Lukas Helfen
Thilo F. Morgeneyer
F. Xu
  • Fonction : Auteur
Burkhard Schillinger
  • Fonction : Auteur
T. Baumbach
  • Fonction : Auteur

Résumé

Computed laminography has been introduced to synchrotron and neutron imaging set-ups to complement computed tomography for three-dimensional imaging of laterally extended (i. e. plate-like) specimens. The wide application field of computed laminography due to different contrast modes (X-ray or neutron absorption and X-ray phase contrast) and spatial resolutions ranging from some 100 down to approximately 0.5 μm is demonstrated. Selected examples from device inspection and from materials science are reported. They outline the interest of the method for nondestructive and in-situ measurements of regions of interest in large planar specimens where engineering-relevant boundary conditions have to be met. With a materials science background, the in-situ investigation of crack propagation in aluminium sheets and carbon-fibre composite panels under mechanical loading is reported.
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Dates et versions

hal-00683973 , version 1 (30-03-2012)

Identifiants

Citer

Lukas Helfen, Thilo F. Morgeneyer, F. Xu, M. Mavrogordato, I. Sinclair, et al.. Synchrotron and neutron laminography for three-dimensional imaging of devices and flat material specimens. International Journal of Materials Research, 2012, 103, pp.170-173. ⟨10.3139/146.110668⟩. ⟨hal-00683973⟩
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