Characterization of surface roughness by means of wavelet analysis - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2011

Characterization of surface roughness by means of wavelet analysis

(1) , (1) , (2) , (2)
1
2
Fichier non déposé

Dates et versions

hal-00835058 , version 1 (18-06-2013)

Identifiants

  • HAL Id : hal-00835058 , version 1

Citer

Bruno Figliuzzi, Dominique Jeulin, Gabriel Fricout, Jean-Jacques Piezanowski. Characterization of surface roughness by means of wavelet analysis. 13th International Conference on Metrology and Properties of Engineering Surfaces, Apr 2011, Twickenham, United Kingdom. ⟨hal-00835058⟩
227 Consultations
0 Téléchargements

Partager

Gmail Facebook Twitter LinkedIn More