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Conference papers

Characterization of surface roughness by means of wavelet analysis

Bruno Figliuzzi 1 Dominique Jeulin 1 Gabriel Fricout 2 Jean-Jacques Piezanowski 2 
1 CMM - Centre de Morphologie Mathématique
2 ArcelorMittal Maizières Research SA
Keywords : Freeform Surface Measurement and Characterisation
Document type :
Conference papers
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https://hal-mines-paristech.archives-ouvertes.fr/hal-00835058
Contributor : Bibliothèque MINES ParisTech Connect in order to contact the contributor
Submitted on : Tuesday, June 18, 2013 - 7:08:29 AM
Last modification on : Wednesday, November 17, 2021 - 12:27:09 PM

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  • HAL Id : hal-00835058, version 1

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INSTITUT-TELECOM | ENSMP | ENSMP_CMM | PARISTECH | PSL | ENSMP_DR

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Bruno Figliuzzi, Dominique Jeulin, Gabriel Fricout, Jean-Jacques Piezanowski. Characterization of surface roughness by means of wavelet analysis. 13th International Conference on Metrology and Properties of Engineering Surfaces, Apr 2011, Twickenham, United Kingdom. ⟨hal-00835058⟩

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