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Conference papers

Characterization of surface roughness by means of wavelet analysis

Bruno Figliuzzi 1 Dominique Jeulin 1 Gabriel Fricout 2 Jean-Jacques Piezanowski 2
1 CMM - Centre de Morphologie Mathématique
2 ArcelorMittal Maizières Research SA
Keywords : Freeform Surface Measurement and Characterisation
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Conference papers
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Submitted on : Tuesday, June 18, 2013 - 7:08:29 AM
Last modification on : Thursday, September 24, 2020 - 4:38:04 PM

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  • HAL Id : hal-00835058, version 1

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Bruno Figliuzzi, Dominique Jeulin, Gabriel Fricout, Jean-Jacques Piezanowski. Characterization of surface roughness by means of wavelet analysis. 13th International Conference on Metrology and Properties of Engineering Surfaces, Apr 2011, Twickenham, United Kingdom. ⟨hal-00835058⟩

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