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Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy

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https://hal-mines-paristech.archives-ouvertes.fr/hal-00881212
Contributor : Louis Raimbault <>
Submitted on : Thursday, November 7, 2013 - 5:23:01 PM
Last modification on : Friday, September 10, 2021 - 1:50:12 PM

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Nikolay Djourelov, Benoît Marchand, Hristo Marinov, Nathalie Moncoffre, Yves Pipon, et al.. Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy. Journal of Nuclear Materials, Elsevier, 2013, 443 (1-3), pp.562-569. ⟨10.1016/j.nucmat.2013.07.066⟩. ⟨hal-00881212⟩

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