https://hal-mines-paristech.archives-ouvertes.fr/hal-00906499 Contributor : François WillotConnect in order to contact the contributor Submitted on : Tuesday, November 19, 2013 - 9:39:20 PM Last modification on : Wednesday, November 17, 2021 - 12:27:08 PM
Maxime Moreaud, Dominique Jeulin, Vincent Morard. TEM Image Analysis, Modelling: Application To Boehmite Nanoparticles. Journal of Microscopy, Wiley, 2012, 245 (2), pp.186-199. ⟨hal-00906499⟩