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TEM Image Analysis, Modelling: Application To Boehmite Nanoparticles

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https://hal-mines-paristech.archives-ouvertes.fr/hal-00906499
Contributor : François Willot <>
Submitted on : Tuesday, November 19, 2013 - 9:39:20 PM
Last modification on : Thursday, September 24, 2020 - 4:38:02 PM

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  • HAL Id : hal-00906499, version 1

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Maxime Moreaud, Dominique Jeulin, Vincent Morard. TEM Image Analysis, Modelling: Application To Boehmite Nanoparticles. Journal of Microscopy, Wiley, 2012, 245 (2), pp.186-199. ⟨hal-00906499⟩

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