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Microstructural characterization of internal welding defects and their effect on the tensile behavior of FSW joints of AA2198 Al-Cu-Li alloy

Abstract : Internal features and defects such as joint line remnant, kissing bond, and those induced by an initial gap between the two parent sheets were investigated in AA2198-T851 friction stir welded joints. They were compared with the parent material and to defect-free welds obtained using a seamless sheet. The cross-weld tensile strength was reduced by the defects by less than 6 pct. The fracture elongation was not significantly affected in view of experimental scatter. Fracture location, however, changed from the thermomechanically affected zone (retreating side) to the defect in the weld nugget for the welds bearing a kissing bond and for some of the gap welds. The kissing bond was shown by EBSD to be an intergranular feature; it fractured under a normal engineering stress close to 260 MPa during an in situ SEM tensile test. Synchrotron tomography after interrupted tensile testing confirmed opening of the kissing bond. For an initial gap of 23 pct of the sheet thickness, intergranular fracture of copper-enriched or oxide-bearing grain boundaries close to the nugget root was evidenced. The stress and strain state of cross-weld specimens loaded under uniaxial tension was assessed using a 3D finite element, multi-material model, determined on the basis of experimental data obtained on the same specimens using digital image correlation.
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https://hal-mines-paristech.archives-ouvertes.fr/hal-01095768
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Submitted on : Tuesday, December 16, 2014 - 11:01:50 AM
Last modification on : Tuesday, March 16, 2021 - 3:44:42 PM

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Thomas Le Jolu, Thilo F. Morgeneyer, Anne Denquin, Mohamed Sennour, Anne Laurent, et al.. Microstructural characterization of internal welding defects and their effect on the tensile behavior of FSW joints of AA2198 Al-Cu-Li alloy. Metallurgical and Materials Transactions A, Springer Verlag/ASM International, 2014, 45, pp.5531-5544. ⟨10.1007/s11661-014-2537-1⟩. ⟨hal-01095768⟩

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