Thomas Geoffroy, Jean-Christophe Riou, Eric Bailly, Gilles Tarisse, Yves Bienvenu. Influence of thermo-mechanical stress on the microstructure of sintered silver joints for microelectronics
.
2015 IEEE CPMT Symposium Japan (ICSJ), Nov 2015, Kyoto, Japan. pp.62-65,
⟨10.1109/ICSJ.2015.7357360⟩.
⟨hal-01336867⟩