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Coupled EBSD, NanoSIMS and FIB techniques for Atom Probe Tomography specimen preparation

C Debreux 1 Frederic Danoix 1 Didier Blavette 1 D Gibouin 1 Laurence Chevalier 1 Fabien Cuvilly 1 T. Sourmail 2 Nathalie Gey 3, 4 
1 GPM - Groupe de physique des matériaux
2 Asco Industries CREAS
3 Labex DAMAS
4 LEM3 - Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux
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Conference papers
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https://hal-mines-paristech.archives-ouvertes.fr/hal-01513108
Contributor : LEM3 UL Connect in order to contact the contributor
Submitted on : Monday, April 24, 2017 - 4:27:27 PM
Last modification on : Friday, August 5, 2022 - 2:54:00 PM

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  • HAL Id : hal-01513108, version 1

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ENSMP | CNRS | INSA-ROUEN | PARISTECH | COMUE-NORMANDIE | UNIV-LORRAINE | LEM3-UL | GPM | UNIROUEN | INSA-GROUPE | DAMAS | ARTS-ET-METIERS-SCIENCES-ET-TECHNOLOGIES

Citation

C Debreux, Frederic Danoix, Didier Blavette, D Gibouin, Laurence Chevalier, et al.. Coupled EBSD, NanoSIMS and FIB techniques for Atom Probe Tomography specimen preparation. PTM 2015 - International conference on solid-solid phase transformations in inorganic materials, Jun 2015, Whistler, Canada. ⟨hal-01513108⟩

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