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Joint Distribution-Based Test Selection for Fault Detection and Isolation Under Multiple Faults Condition

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https://hal-mines-paristech.archives-ouvertes.fr/hal-03479880
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Submitted on : Tuesday, December 14, 2021 - 3:05:15 PM
Last modification on : Monday, January 3, 2022 - 2:54:01 PM

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Yang Li, Enrico Zio, Ningyun Lu, Xiuli Wang, Bin Jiang. Joint Distribution-Based Test Selection for Fault Detection and Isolation Under Multiple Faults Condition. IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2021, 70, pp.1-13. ⟨10.1109/TIM.2020.3031983⟩. ⟨hal-03479880⟩

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